发明名称 APPARATUS FOR INSPECTING SURFACE AND METHOD THEREOF
摘要 An apparatus for inspecting a surface, and a method for inspecting a surface by using the same are provided to perfectly detect all alien substances placed on a top side or a bottom side of a substrate, inspect a bad substrate having protrusions on a surface, and simplify inner construction. An optical sensor(130) includes a light emitting part(132) and a light receiving part(134) transmitting and receiving light in a direction parallel with an inspection plane of an inspection object at a point separated from the inspection plane of the inspection object at a predetermined gap. A driving unit transfers the optical sensor to the inspection object in a direction parallel with the inspection plane of the inspection object and in direction of crossing with emitting direction of the optical sensor.
申请公布号 KR20070001777(A) 申请公布日期 2007.01.04
申请号 KR20050111907 申请日期 2005.11.22
申请人 K.C.TECH CO., LTD. 发明人 CHO, KANG IL;NOH, JI SEONG;KWON, SEONG
分类号 G02F1/13 主分类号 G02F1/13
代理机构 代理人
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