发明名称 |
LAYER GROWTH USING METAL FILM AND/OR ISLANDS |
摘要 |
<p>A solution for manufacturing a nitride-based heterostructure, semiconductor; device, or the like, by growing one or more layers using a metal film and/or nitride islands is provided. In an embodiment of the invention, a group-Ill nitride film is grown on a surface of a lower layer. The nitride film is grown by first epitaxially growing a group-Ill metal film on the surface in a substantially nitrogen-free atmosphere. The group-Ill metal film is grown such that it covers substantially an entire area of the surface. Next, the group-Ill metal film is nitridated to form a group-Ill nitride film. This process can be repeated one or more times to form the layer. In another embodiment of the invention, islands are formed on a surface of a lower layer from a group-Ill nitride film. The islands can be used to subsequent group-Ill nitride growth to form the group-Ill nitride layer. The invention provides an improved solution for growing a layer that can be used to generate heterostructures/semiconductors/devices having improved characteristics.</p> |
申请公布号 |
WO2007002028(A2) |
申请公布日期 |
2007.01.04 |
申请号 |
WO2006US23896 |
申请日期 |
2006.06.20 |
申请人 |
SENSOR ELECTRONIC TECHNOLOGY, INC.;GASKA, REMIGIJUS;ZHANG, JIANGPING;SHUR, MICHAEL |
发明人 |
GASKA, REMIGIJUS;ZHANG, JIANGPING;SHUR, MICHAEL |
分类号 |
H01L21/20;H01L21/36;H01L31/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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