发明名称 METHODS OF EXPOSURE FOR THE PURPOSE OF THERMAL MANAGEMENT FOR IMPRINT LITHOGRAPHY PROCESSES
摘要 The present invention is directed to a method that attenuates, if not avoids, heating of a substrate undergoing imprint lithography process and the deleterious effects associated therewith. To that end, the present invention includes a method of patterning a field of a substrate with a polymeric material that solidifies in response to actinic energy in which a sub-portion of the field is exposed sufficient to cure the polymeric material is said sub-portion followed by a blanket exposure of all of the polymeric material associated with the entire field to cure/ solidify the same.
申请公布号 WO2006060758(A3) 申请公布日期 2007.01.04
申请号 WO2005US43872 申请日期 2005.11.30
申请人 MOLECULAR IMPRINTS, INC. 发明人 SREENIVASAN, SIDLGATA V.;CHOI, BYUNG-JIN
分类号 H01L21/31;H01L21/324 主分类号 H01L21/31
代理机构 代理人
主权项
地址