发明名称 |
Measurement arrangement for carrying out irradiation attempts using e.g. ultra violet light such as in lithography systems |
摘要 |
<p>The apparatus has a gas tight housing (1) with a light entry window (2) and a sample holder (5,6,7). A light exit window (3) is disposed in the housing opposite the entry window. A light measuring device (4) is arranged behind the exit window for carrying out in-situ transmission attempts. Independent claims also cover a method of irradiation.</p> |
申请公布号 |
DE102005028847(A1) |
申请公布日期 |
2007.01.04 |
申请号 |
DE20051028847 |
申请日期 |
2005.06.22 |
申请人 |
CARL ZEISS SMT AG |
发明人 |
DUESING, RUEDIGER;ZEHETBAUER, MARCUS |
分类号 |
G01N17/00 |
主分类号 |
G01N17/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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