发明名称 Lithographic apparatus and device manufacturing method
摘要 A lithographic apparatus includes an illumination unit including a radiation source configured to generate a radiation bundle, an illumination optics with a numerical aperture NA<SUB>0 </SUB>and an aperture system; a projection lens having a first numerical aperture NA<SUB>OB1</SUB>; a support arranged between the illumination unit and the projection lens and configured to support a patterning device; a substrate support configured to support a substrate on which structures on the patterning device are imaged, wherein the first numerical aperture NA<SUB>OB1 </SUB>of the projection lens is smaller than the numerical aperture NA<SUB>0 </SUB>of the illumination unit.
申请公布号 US2007002300(A1) 申请公布日期 2007.01.04
申请号 US20060436058 申请日期 2006.05.18
申请人 ASML NETHERLANDS B.V. 发明人 HANSEN STEVEN G.;FLAGELLO DONIS G.;SINGER WOLFGANG;GEH BERND P.;BLAHNIK VLADAN
分类号 G03B27/54 主分类号 G03B27/54
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