发明名称 Manufacturing processing for an isolated transistor with strained channel
摘要 Transistor type semiconducting device comprising: a substrate, an insulating layer comprising sidewalls formed on each part of the source zone and the drain zone, drain, channel and source zones, the channel zone being formed on the insulating layer and being strained by the drain and the source zones, between the side parts, a grid, separated from the channel by a grid insulator.
申请公布号 US2007001227(A1) 申请公布日期 2007.01.04
申请号 US20060454398 申请日期 2006.06.16
申请人 BARBE JEAN-CHARLES;BARRAUD SYLVIAN;FENOUILLET-BERANGER CLAIRE;GALLON CLAIRE;HALIMAOUI AOMAR 发明人 BARBE JEAN-CHARLES;BARRAUD SYLVIAN;FENOUILLET-BERANGER CLAIRE;GALLON CLAIRE;HALIMAOUI AOMAR
分类号 H01L27/12 主分类号 H01L27/12
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