发明名称 Unique pBIST Features for Advanced Memory Testing
摘要 This invention is new built-in self test instructions. A pointer register stores data identifying one bit of a data register. That bit determines whether the data of another data register is used in test in native form or in inverted form. Different built-in self test instructions update pointer including reset to the first bit, no change, increment to the next bit and decrement to the previous bit. For write instructions the selected normal or inverted data is written into memory. For read instructions the selected normal or inverted data is compared with data read from a memory.
申请公布号 US2007006033(A1) 申请公布日期 2007.01.04
申请号 US20060422732 申请日期 2006.06.07
申请人 DAMODARAN RAGURAM;RAMAMURTI ANANTHAKRISHNAN 发明人 DAMODARAN RAGURAM;RAMAMURTI ANANTHAKRISHNAN
分类号 G06F11/00 主分类号 G06F11/00
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