发明名称 Multi-scale analysis device
摘要 The distortion of each node is calculated from the distortions of respective elements in the finite element analysis result of a global model of a structure, and a second-order coefficient of a quadratic function representing the displacement at each node of a micro model is calculated from distortions of respective nodes. In addition, a constant term and a first-order coefficient of the quadratic function are calculated from the displacements of the respective nodes of the global model. Then, the displacement at each boundary node of the micro model is calculated using the obtained quadratic function and a finite element analysis of the micro model is performed.
申请公布号 US2007005310(A1) 申请公布日期 2007.01.04
申请号 US20050237936 申请日期 2005.09.29
申请人 FUJITSU LIMITED 发明人 SAKAI HIDEHISA
分类号 G06F17/10 主分类号 G06F17/10
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