发明名称 SPIN COATING METHOD
摘要 <p>A spin coating method is provided to form uniformly a photoresist layer on the entire surface of a wafer by dropping a coating material on a predetermined portion spaced apart from a center axis of the wafer. A coating material(120) is dropped on a predetermined portion spaced apart from a center axis of a wafer(110). The coating material is spread to fill a center portion of the wafer. The wafer is spun in a first rotation speed in order to distribute the coating material on the wafer itself. The wafer is then spun in a second rotation speed in order to form uniformly the coating material on the entire surface of the wafer. The number of dropping points of the coating material is at least four.</p>
申请公布号 KR20070000014(A) 申请公布日期 2007.01.02
申请号 KR20050055032 申请日期 2005.06.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, SUK KWANG
分类号 H01L21/027 主分类号 H01L21/027
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