发明名称 |
CMOS IMAGE SENSOR, AND METHOD FOR FABRICATING THE SAME |
摘要 |
A CMOS image sensor, and a method for fabricating the same are provided to prevent loss of incident rays by forming a passivation layer without forming a step. A plurality of metal lines(204) are formed on a substrate(201). A planarization layer(203) is formed on the substrate in order to planarize the substrate including the metal lines. A passivation layer(205) is formed on the planarization layer without forming a step thereon. The planarization layer is buried between adjacent metal lines patterns in order to be formed equally to the metal line patterns. The metal lines are connected with a lower metal line by a contact plug.
|
申请公布号 |
KR20070000243(A) |
申请公布日期 |
2007.01.02 |
申请号 |
KR20050055816 |
申请日期 |
2005.06.27 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
CHO, JIN YOUN;LIM, JUNG EUN |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|