发明名称 CMOS IMAGE SENSOR, AND METHOD FOR FABRICATING THE SAME
摘要 A CMOS image sensor, and a method for fabricating the same are provided to prevent loss of incident rays by forming a passivation layer without forming a step. A plurality of metal lines(204) are formed on a substrate(201). A planarization layer(203) is formed on the substrate in order to planarize the substrate including the metal lines. A passivation layer(205) is formed on the planarization layer without forming a step thereon. The planarization layer is buried between adjacent metal lines patterns in order to be formed equally to the metal line patterns. The metal lines are connected with a lower metal line by a contact plug.
申请公布号 KR20070000243(A) 申请公布日期 2007.01.02
申请号 KR20050055816 申请日期 2005.06.27
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 CHO, JIN YOUN;LIM, JUNG EUN
分类号 H01L27/146 主分类号 H01L27/146
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