发明名称 Semiconductor device that suppresses variations in high frequency characteristics of circuit elements
摘要 A semiconductor device includes a semiconductor substrate having a main surface, the main surface including a first area formed with a high-frequency circuit element and a second area located around the first area and formed with a low-frequency circuit element. The semiconductor device also includes a sealing resin which covers the main surface; a plurality of first external terminals which are formed above the second area and which are electrically connected to the high-frequency circuit element, the first external terminals protruding from the surface of the sealing resin. The semiconductor device further includes a plurality of second external terminals which are formed above the second area and which are electrically connected to the low-frequency circuit element, the second external terminals protruding from the surface of the sealing resin.
申请公布号 US7157794(B2) 申请公布日期 2007.01.02
申请号 US20020289384 申请日期 2002.11.07
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 MORI HIROYUKI
分类号 H01L23/12;H01L23/02;H01L23/04;H01L23/31;H01L23/48;H01L23/485;H01L23/52;H01L23/522;H01L23/66;H01L25/04;H01L25/18;H01L29/40 主分类号 H01L23/12
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