发明名称 Methods and apparatus for thermal management of an integrated circuit die
摘要 An integrated, on-chip thermal management system providing closed-loop temperature control of an IC device and methods of performing thermal management of an IC device. The thermal management system comprises a temperature detection element, a power modulation element, a control element, and a visibility element. The temperature detection element includes a temperature sensor for detecting die temperature. The power modulation element may reduce the power consumption of an IC device by directly lowering the power consumption of the IC device, by limiting the speed at which the IC device executes instructions, by limiting the number of instructions executed by the IC device, or by a combination of these techniques. The control element allows for control over the behavior of the thermal management system, and the visibility element allows external devices to monitor the status of the thermal management system.
申请公布号 US7158911(B2) 申请公布日期 2007.01.02
申请号 US20040821822 申请日期 2004.04.09
申请人 INTEL CORPORATION 发明人 GUNTHER STEPHEN H.;BINNS FRANK;PIPPIN JACK D.;RANKIN LINDA J.;BURTON EDWARD A.;CARMEAN DOUGLAS M.;BAUER JOHN M.
分类号 G01K7/01;G06F1/20 主分类号 G01K7/01
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