发明名称 Circuit and method for measuring jitter of high speed signals
摘要 A method and circuit for measuring a statistical value of jitter for a data signal having a data rate f<SUB>D</SUB>, comprises digitally sampling the data signal at a sampling rate, f<SUB>S</SUB>, to produce sampled logic values, where f<SUB>D</SUB>/f<SUB>S </SUB>is a predetermined non-integer ratio; and analyzing the sampled values to deduce a statistical value of the jitter.
申请公布号 US7158899(B2) 申请公布日期 2007.01.02
申请号 US20040947189 申请日期 2004.09.23
申请人 LOGICVISION, INC. 发明人 SUNTER STEPHEN K.;ROY AUBIN P. J.
分类号 G01R29/00;H04L1/20;H04Q1/20 主分类号 G01R29/00
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