发明名称 WAFER TRANSFER APPARATUS AND TRANSFERING METHOD FOR THE WAFER
摘要 A wafer transfer apparatus and a wafer transfer method are provided to prevent the damage of a transfer arm or contamination of process equipment by using a predetermined sensor capable of detecting the vibration applied to the transfer arm. A wafer transfer apparatus includes a support unit, a transfer arm, a control unit and a sensor. The support unit(110) is used for supporting a wafer. The transfer arm(120) is installed at one side of the support unit in order to transfer the wafer. The control unit(140) is used for controlling the operation of the transfer arm. The sensor(130) is used for detecting the vibration applied to the support unit or the transfer arm. The sensor is installed at one end portion of the transfer arm.
申请公布号 KR20070000296(A) 申请公布日期 2007.01.02
申请号 KR20050055919 申请日期 2005.06.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HAN, YU JIN
分类号 H01L21/68 主分类号 H01L21/68
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