发明名称 Fabrication of thin film germanium infrared sensor by bonding to silicon wafer
摘要 A method of fabricating a thin film germanium photodetector includes preparing a silicon substrate; fabricating a CMOS device on the silicon substrate; preparing a germanium substrate; preparing surfaces of each substrate for bonding; bonding the germanium substrate to the CMOS-bearing silicon substrate to form a bonded structure; removing a portion of the germanium substrate from the bonded structure; forming a PIN diode in the germanium substrate; removing a portion of the germanium layer by etching; and completing the germanium photo detector.
申请公布号 US7157300(B2) 申请公布日期 2007.01.02
申请号 US20040993533 申请日期 2004.11.19
申请人 SHARP LABORATORIES OF AMERICA, INC. 发明人 LEE JONG-JAN;MAA JER-SHEN;HSU SHENG TENG;TWEET DOUGLAS J.
分类号 H01L21/00 主分类号 H01L21/00
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