| 摘要 |
A method is provided for testing magnetic bits ( 3, 104, 514 ) of an array. A train of first ( 702 ), second ( 704 ), and third ( 706 ) pulses is provided to a desired bit, the first and second pulses beginning at a substantially similar low field and increasing in similar amounts with respect to successive trains of the first, second, and third pulses, the third pulse having a current amplitude sufficient to toggle the magnetic bit. A representative count is recorded in response to switching of the bit. The above steps are repeated and a determination is made of the current amplitude required to write and toggle the bit.
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