发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND COMPUTER STORAGE MEDIUM
摘要 PROBLEM TO BE SOLVED: To form a PZT film having (111) orientation by an MOCVD method. SOLUTION: A PTO nucleation layer having the (111) orientation is formed to a thickness of 5 nm or thicker, preferably 8 nm or thicker by a low oxygen partial pressure of less than 340 Pa by the MOCVD method, and the PZT film is formed on it by the MOCVD method. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006351828(A) 申请公布日期 2006.12.28
申请号 JP20050176060 申请日期 2005.06.16
申请人 TOKYO ELECTRON LTD 发明人 MATSUMOTO KENJI;NASU KATSUYUKI;SAKOTA TOMOYUKI
分类号 H01L21/316;C23C16/02;H01L21/8246;H01L27/105 主分类号 H01L21/316
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