Compensation signal generating device for compensating mechanical stress on semiconductor circuit, has evaluation mechanism providing compensation signal that is measure for mechanical stress acting on semiconductor circuit substrate

摘要

The device has a temperature detecting mechanism detecting temperature of a semiconductor circuit substrate and a processing mechanism generating a corrected discrepancy signal based on the detected temperature. An evaluation mechanism (16) provides a compensation signal based on an intermediate compensation signal and the discrepancy signal, where the compensation signal is a measure for mechanical stress acting on the substrate. An independent claim is also included for a method of determining a compensation signal.