| 摘要 |
PROBLEM TO BE SOLVED: To detect the quality of one pixel part without being influenced by other pixel parts and to stably determine the quality of the pixel part even when noise is applied in a substrate for electrooptical apparatus such as a TFT array substrate. SOLUTION: The substrate for electrooptical apparatus is provided with: a substrate; a plurality of scanning lines and a plurality of data lines arrayed so as to intersect with each other on the substrate; a plurality of pixel parts each of which is formed in each two intersections placed on one scanning line which are formed by allowing each group of two adjacent data lines out of the plurality of data lines to intersect with one scanning line out of the plurality of scanning lines; and a plurality of pixel inspection circuits electrically connected to each group of two data lines. Two pixel parts adjacent to each other along the data line or the scanning line out of the plurality of pixel parts are electrically connected to mutually different data lines. COPYRIGHT: (C)2007,JPO&INPIT |
