| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of specifying broken elements among the elements contained in an integrated circuit, without increasing terminals for a performance test. SOLUTION: The semiconductor device has a semiconductor circuit containing a plurality of macroinstructions 101 and 102. In the semiconductor device, an input-output terminal 107 inputting a signal to at least either of the macroinstructions 101 and 102, while outputting the signal from at least one of the macroinstructions 101 and 102 is fitted. In the semiconductor device, a test control circuit 110, changing over the operation of the input or output of the signal, is fitted in the input/output terminal 107, when the macroinstructions 101 and 102 are operated normally and when they are tested. COPYRIGHT: (C)2007,JPO&INPIT
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