发明名称 INTERFEROMETER AND SHAPE MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an interferometer easily adjusting arrangement of a measuring object while avoiding interference noise. SOLUTION: A wavelength variable light source 201 can change the wavelengthλof outgoing light in the range of scanning widthΔλ. The coherence length L of the interferometer 200 is determined byΔλandλ. A control part 300 sets the scanning widthΔλto a proper size and makes a CCD camera 209 take a coherence fringe image. At this time, exposure time Te is set longer than the time for wavelength scanning. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006349657(A) 申请公布日期 2006.12.28
申请号 JP20060029167 申请日期 2006.02.07
申请人 MITSUTOYO CORP 发明人 KAWASAKI KAZUHIKO;SUZUKI YOSHIMASA;SESKO DAVID W
分类号 G01B9/02;G01B11/24 主分类号 G01B9/02
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