发明名称 Semiconductor device
摘要 The barrier phi<SUB>b </SUB>between the Fermi level Ef of Se and the valence band of the wide band gap p-type semiconductor becomes the lowest by including the Se layer in the p-type ohmic electrode, and an ohmic contact is achieved that has a resistance far lower than that obtained when the metal layer having high work function of prior art is arranged on the wide band gap p-type semiconductor.
申请公布号 US2006289877(A1) 申请公布日期 2006.12.28
申请号 US20060474459 申请日期 2006.06.26
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD 发明人 HIROSE YUTAKA
分类号 H01L21/28 主分类号 H01L21/28
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