发明名称 EXPOSURE APPARATUS AND IMAGE OBSERVING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide an exposure apparatus capable of controlling the temperature of a movable part without directly supplying a refrigerant to the movable part. <P>SOLUTION: A wafer stage holds a wafer attached on a reference base in a vacuum container and to be exposed. A mask stage (6) holds an exposure mask. A beam source (7) irradiates the wafer with an energy beam for exposure through the exposure mask. An intermediate block (21) is supported so as to be movable in a two-dimensional direction. A cooling means including a heat-absorbing section (35) is fixed on the reference base. An optical device (20) is supported so as to be movable in an optical axis direction. The optical device used to observe an alignment mark on the exposure mask. A first heat transmitting structure (36) forms a heat transmitting path between the intermediate block and the heat-absorbing section, and permits the intermediate block to move in a two-dimensional direction. A second heat transmitting structure (39) forms a heat transmitting path between the intermediate block and the optical device, and permits the optical device to move. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006351742(A) 申请公布日期 2006.12.28
申请号 JP20050174537 申请日期 2005.06.15
申请人 SUMITOMO HEAVY IND LTD 发明人 YANO TAKASHI
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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