发明名称 Multi-beam ion mobility time-of-flight mass spectrometer with bipolar ion extraction and zwitterion detection
摘要 The present invention relates generally to instrumentation and methodology for the characterization of chemical samples in solutions or on a surface which is based on modified ionization methods with or without adjustable pH and controllable H-D exchange in solution, an improved ion mobility spectrometer (IMS), a multi-beam ion pre-selection of the initial flow, and coordinated mobility and mass ion separation and detection using a single or several independent time-of-flight mass spectrometers for different beams with methods for fragmenting ion mobility-separated ions and multi-channel data recording
申请公布号 US2006289747(A1) 申请公布日期 2006.12.28
申请号 US20060441768 申请日期 2006.05.26
申请人 IONWERKS, INC. 发明人 SCHULTZ J. A.;RAZNIKOV VALERI V.;EGAN THOMAS F.;UGAROV MICHAEL V.;TEMPEZ AGNES;RAZNIKOVA MARINA O.;TARASENKO VALENTIN A.
分类号 H01J49/00 主分类号 H01J49/00
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