| 摘要 |
Scanning probe microscopes include a probe tip coupled to a tuning fork or other acoustic resonator so as to apply a shear force when contacted to a specimen surface based on an applied acoustic signal. A secondary ultrasonic transducer is in acoustic communication with the specimen. The probe tip and the secondary ultrasonic transducer are acoustically coupled when the probe tip is in proximity to a specimen surface. Changes in resonance frequency, admittance, or other characteristic of acoustic signals coupled to the probe tip or a secondary ultrasonic transducer secured to either the specimen or the probe tip can be used in specimen imaging or to estimate probe tip placement respect to a specimen surface. |
