发明名称 Mass spectrometer
摘要 A mass spectrometer capable of realizing a high-sensitivity ion analysis and a high ion selectivity performance. The mass spectrometer includes the ion source where ions are produced, the ion trap where ions are accumulated, isolated, dissociated, and ejected, the detector to detect ions to be detected, and the controller to control operations of the ion trap. It has the features that the total ion accumulation in or just before each period is calculated based on the result obtained from the mass spectrometry in the preceding period, and that in at least one out of all periods, the condition of voltage applied to the ion trap is corrected depending on the total ion accumulation. Compared to the related art, the mass spectrometer of the present invention provides much improved performance in analysis sensitivity and ion selectivity.
申请公布号 US2006289743(A1) 申请公布日期 2006.12.28
申请号 US20060446141 申请日期 2006.06.05
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 HASEGAWA HIDEKI;HASHIMOTO YUICHIRO;WAKI IZUMI
分类号 H01J49/00 主分类号 H01J49/00
代理机构 代理人
主权项
地址