| 摘要 |
<P>PROBLEM TO BE SOLVED: To facilitate a shift to a test mode and a test of a functional block without requiring a terminal dedicated for testing, a terminal also used for testing, and a decoding circuit for selecting a target functional block. <P>SOLUTION: When a test command code preset to a microprogram ROM part 11 is executed, execution control of the program is shifted to a test mode memory area block 41, and the functional block 3 to be tested is tested by an access control part 12 and a selector circuit 2 corresponding to an evaluation program written in the test mode memory area block 41. <P>COPYRIGHT: (C)2007,JPO&INPIT |
