发明名称 Board inspecting apparatus, its parameter setting method and parameter setting apparatus
摘要 <p>For each teaching image, a plurality of patterns of color pickup regions each include a first region (73) for picking up a color of a first part and a second region (74) for picking up a color of a second part are set, a color of each pixel in the first region (73) and a color of each pixel in the second region (74) are mapped as a target point and an exclusion point, respectively to a color space for each of the patterns of the color pickup regions, a degree in separation between a target point distribution and an exclusion point distribution in the color space is calculated for each of the patterns of the color pickup regions, a pattern of a color pickup region having a maximum degree in separation is selected, a color range which divides the color space and has the largest difference between the number of target points and the number of exclusion points in the selected pattern therein is found, and the found color range is set as a color condition used for a board inspecting process.</p>
申请公布号 EP1736758(A2) 申请公布日期 2006.12.27
申请号 EP20060115773 申请日期 2006.06.21
申请人 OMRON CORPORATION 发明人 MORIYA, TOSHIHIRO;NAKAJIMA, AKIRA;SHIMIZU, ATSUSHI;ONISHI, TAKAKO;WADA, HIROTAKA
分类号 G01N21/956;G06T7/00 主分类号 G01N21/956
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