发明名称 Simulation of X-ray emission spectra for material identification
摘要 A method of identifying a material using an x-ray emission characteristic is provided. X-ray data representing a monitored x-ray emission characteristic is obtained from a specimen in response to an incident energy beam. A dataset is also obtained, this comprising composition data of a plurality of materials. The material of the specimen is contained within the dataset. Predicted x-ray data are calculated for each of the materials in the dataset using the composition data The obtained and the predicted x-ray data are compared and the likely identity of the material of the specimen is determined, based upon the comparison.
申请公布号 EP1736759(A1) 申请公布日期 2006.12.27
申请号 EP20060252989 申请日期 2006.06.09
申请人 OXFORD INSTRUMENTS ANALYTICAL LIMITED 发明人 STATHAM, PETER JOHN
分类号 G01N23/22 主分类号 G01N23/22
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