发明名称 |
SEMICONDUCTOR DEVICE HAVING A GATE INSULATING LAYER OF A HIGH DIELECTRIC CONSTANT AND METHOD OF MANUFACTURING THE SAME |
摘要 |
A semiconductor device and its manufacturing method are provided to secure the reliability by reducing a leakage current and a threshold voltage enough using an enhanced dual gate insulating layer structure composed of different material portions. A semiconductor device comprises a semiconductor substrate and first and second gate structures. The substrate(100) includes a first doped region and a second doped region. The first and second gate structures(107,117) are formed on the first and second doped regions, respectively. The first gate structure is composed of a first gate insulating layer(104) made of a first high-k dielectric material and a first gate electrode(106). The second gate structure is composed of a second gate insulating layer(114) made of a second high-k dielectric material and a second gate electrode(116). |
申请公布号 |
KR20060133933(A) |
申请公布日期 |
2006.12.27 |
申请号 |
KR20060122818 |
申请日期 |
2006.12.06 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG, HYUNG SUK;LEE, JONG HO;RHEE, HWA SUNG;CHOI, JAE KWANG |
分类号 |
H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|