| 摘要 |
A method of mounting an instrument probe using an adapter post is provided. The method includes coupling an attachment end of the adapter post to a first wall defined between a cavity and an annulus, coupling an opposite sealing end of the adapter post to a second wall defined between the annulus and the ambient area, sealing the adapter post to compensate for a relative movement between the first wall and the second wall such that the sealing is maintained, and inserting the instrument probe at least partially within the adapter post to monitor a process parameter within the cavity.
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