发明名称 Method and apparatus for detecting an unused state in a semiconductor circuit
摘要 An unused state detection circuit is disclosed that detects an unused state in a semiconductor circuit. A semiconductor circuit is "unused" when the unused state detection circuit has not been permanently cleared. When a semiconductor circuit is first powered up, the unused state detection circuit will detect that the semiconductor circuit has not previously been "used" and can automatically activate a boot up procedure or a testing procedure (or both). After the semiconductor circuit is used, the unused state detection circuit provides an indication that the semiconductor circuit is no longer unused. The unused state detection circuit uses the state of a dedicated non-volatile memory array or a dedicated region of the general non-volatile memory portion of the semiconductor circuit to detect whether the semiconductor circuit has been previously unused.
申请公布号 US7155357(B2) 申请公布日期 2006.12.26
申请号 US20030339218 申请日期 2003.01.09
申请人 SILICON STORAGE TECHNOLOGY, INC. 发明人 HOLLMER SHANE
分类号 G06F19/00;G01N37/00;G01R31/317;G06F9/00;G06F11/22;G11C7/20;G11C29/00;G11C29/12;H01L21/66 主分类号 G06F19/00
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