发明名称 TEST APPARATUS AND WRITE CONTROL CIRCUIT
摘要 A write control circuit for writing a plurality of command data supplied from a plurality of host computers into a plurality of registers, comprising a plurality of request signal storing parts, provided in association with the plurality of host computers, for storing write request signals from the respective host computers; a host selecting part for sequentially selecting the plurality of request signal storing parts to retrieve and output the data stored in the selected request signal storing parts; and a write part for receiving the stored data outputted by the host selecting part, the command data to be written into a register part, and register part determining data for determining the register part into which the command data is to be written, and for writing the command data into the register part determined by the register part determining data when the received stored data is a write request signal.
申请公布号 KR20060133527(A) 申请公布日期 2006.12.26
申请号 KR20067005092 申请日期 2006.03.13
申请人 ADVANTEST CORPORATION 发明人 SATOU HIROSHI
分类号 G01R31/28;G01R31/3183;G01R31/319;G06F1/04;G06F11/00;G06F11/22;G06F11/24 主分类号 G01R31/28
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