发明名称 Methods and apparatus for scan insertion
摘要 In accordance with the present electronic design automation (EDA) for integrated circuits invention prior to synthesis, dummy elements are added to the library and an internal scan clock pin with no connections is provided. Then the design is synthesized, scan insertion is performed (defining scan chains, inserting chains), and the scan clock is connected to all flip-flops SCLK pins. Finally, the dummy elements are replaced with real gates and clock tree insertion is performed after placing the cell in a layout.
申请公布号 US7155687(B2) 申请公布日期 2006.12.26
申请号 US20040838969 申请日期 2004.05.04
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 CHEUNG HUGO;BRAISZ HERBET
分类号 G06F17/50;G01R31/3185 主分类号 G06F17/50
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