| 摘要 |
A circuit to be tested is divided into a plurality of circuit portions. There are provided a plurality of programmable devices for using simulations to realize the functional operations of the respective circuit portions as divided. Wires for supplying, to the plurality of programmable devices, signals (Sx) to be used by and applied at the same time to the circuit to be tested are provided in such a manner that the maximum skew at the time when the signals (Sx) reach the respective programmable devices is shorter than the minimum time required for forwarding data between the programmable devices. In each of the programmable devices, there is realized an input terminal (PX) for inputting the signal (Sx) from a signal producing apparatus (400), whereby the signal (Sx) can be directly inputted from the signal producing apparatus to suppress occurrence of skew.
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