| 摘要 |
A semiconductor test device is provided to increase the test speed of semiconductor chips by directly applying a high speed synchronous signal to plural semiconductor chips. A semiconductor test device includes a controller(210), a reference semiconductor element(220), plural semiconductor elements(230a~230x) to be tested, and a test logic(240). The controller generates a control signal. The reference semiconductor element receives the control signal and outputs a reference result signal, which is a comparison criterion. The objective semiconductor elements output result signals to be compared with the control signal to determine defectiveness. The test logic paratactically applies the control signal to the objective semiconductor elements and compares the result signals from the semiconductor elements with the reference result signal to determine whether the semiconductor elements are defective. |
