DATA WRITING APPARATUS AND METHOD FOR EDS TEST

摘要

Data writing apparatus and method for an EDS(Electrical Die Sorting) test are provided to reduce a writing time and a test time using a host computer and a tester. A data writing apparatus includes a host computer and a tester. The host computer(1) is used for generating and dumping an input pattern and chip data on each test object element. The tester(2) is used for storing the input pattern and chip data, transforming the input pattern into a logic signal pattern, and writing the logic signal pattern and chip data in the test object element in parallel. The tester is composed of a storing unit for storing the input pattern and the chip data, a control unit for controlling the storing unit and outputting first and second control signals, and a writing unit capable of writing simultaneously the logic signal pattern and chip data into test object elements.