发明名称 MASS SPECTROMETER
摘要 PROBLEM TO BE SOLVED: To provide a mass spectrometer capable of high-sensitivity analysis of ion and high ion-selecting performance. SOLUTION: The mass spectrometer is provided with an ion generating part 1 generating ion, an ion trapping part 12 accumulating, isolating, dissociating, and exhausting ion, a detecting part 33 detecting exhausted ion, and a control part 34 controlling operation of the ion-trapping part. A total ion accumulation volume at each process or just before each process is calculated from results of mass spectrometry immediately before, and voltage conditions impressed on the ion-trapping part depending on the total ion accumulation volume is corrected at least at one of the processes. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006339087(A) 申请公布日期 2006.12.14
申请号 JP20050164962 申请日期 2005.06.06
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 HASEGAWA HIDEKI;HASHIMOTO YUICHIRO;WAKE IZUMI
分类号 H01J49/42;G01N27/62;H01J49/40 主分类号 H01J49/42
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