发明名称 PROBE FOR CURRENT TEST
摘要 PROBLEM TO BE SOLVED: To promote elastic deformation in an arm region regardless of constant position relation between the needle tip and a reference point and of small abrasion of the needle tip. SOLUTION: The probe contains a main member having a tip end region and supported with a supporting member like a cantilever beam and a needle tip member combined in the tip end region of the main member. The needle tip member contains a base part of which at least a part is embedded in the tip end region, a contact part pressed to an inspection object and projecting to the second direction from the base part, and a reference part formed at a location with an interval in the first direction from the contact part and projecting to the second direction crossing with the first direction from the base part. It is manufactured with a harder material than the main member. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006337080(A) 申请公布日期 2006.12.14
申请号 JP20050159332 申请日期 2005.05.31
申请人 MICRONICS JAPAN CO LTD 发明人 HIRAKAWA HIDEKI;SOMA AKIRA;HAYASHIZAKI TAKAYUKI;KUNIYOSHI SHINJI
分类号 G01R1/067;G01R31/26;H01L21/66 主分类号 G01R1/067
代理机构 代理人
主权项
地址