发明名称 Condition-analyzing device
摘要 A condition analysis apparatus capable of grasping the condition of an object easily and accurately is provided. The condition analysis apparatus 1 includes a three-dimensional sensor 10 for measuring sampling-point-moves in the height direction of an object 2 existing in a target area at a plurality of sampling points, and area definition means 22 for defining an area where a plurality of the sampling-point-moves are in the generally same phase. The thus constructed condition analysis apparatus 1 can grasp the condition of the object 2 easily and accurately. Preferably, the condition analysis apparatus 1 includes information output means 40 for outputting information of an area including the area defined by the area definition means 22.
申请公布号 US2006279428(A1) 申请公布日期 2006.12.14
申请号 US20040560027 申请日期 2004.06.03
申请人 KEIO UNIVERSITY 发明人 SATO ISAO;NISHIURA TOMOFUMI;NAKAJIMA MASATO;MIMURA KAZUHIRO;TAKEMURA YASUHIRO;KATOU KEI;TAKESUE TOSHIHARU
分类号 G01B11/24;G08B23/00;A61B5/11;A61B5/113;G01B11/25;G08B21/04;G08B25/00;G08B25/04;H04N5/225 主分类号 G01B11/24
代理机构 代理人
主权项
地址