发明名称 |
Condition-analyzing device |
摘要 |
A condition analysis apparatus capable of grasping the condition of an object easily and accurately is provided. The condition analysis apparatus 1 includes a three-dimensional sensor 10 for measuring sampling-point-moves in the height direction of an object 2 existing in a target area at a plurality of sampling points, and area definition means 22 for defining an area where a plurality of the sampling-point-moves are in the generally same phase. The thus constructed condition analysis apparatus 1 can grasp the condition of the object 2 easily and accurately. Preferably, the condition analysis apparatus 1 includes information output means 40 for outputting information of an area including the area defined by the area definition means 22.
|
申请公布号 |
US2006279428(A1) |
申请公布日期 |
2006.12.14 |
申请号 |
US20040560027 |
申请日期 |
2004.06.03 |
申请人 |
KEIO UNIVERSITY |
发明人 |
SATO ISAO;NISHIURA TOMOFUMI;NAKAJIMA MASATO;MIMURA KAZUHIRO;TAKEMURA YASUHIRO;KATOU KEI;TAKESUE TOSHIHARU |
分类号 |
G01B11/24;G08B23/00;A61B5/11;A61B5/113;G01B11/25;G08B21/04;G08B25/00;G08B25/04;H04N5/225 |
主分类号 |
G01B11/24 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|