发明名称 |
MICROCOMPUTER AND METHOD FOR TESTING THE SAME |
摘要 |
<p>[PROBLEMS] To achieve an at-speed test of a source synchronous interface within ASIC at a board level. [MEANS FOR SOLVING PROBLEMS] A microcomputer (ASIC) incorporates a plurality of ICs connected by use of source synchronous interfaces. In an IC on the data transmission side, to begin with, a data output flip-flop (F1) and a sync clock output flip-flop (F2) input test data. Then, a PLL circuit (11) for generating an operation clock in an actual operation generates a clock signal. In accordance with this clock signal, the first and second flip-flops output the test data and the sync clock. On the other hand, in an IC on a data receiving side, data receiving flip-flops (F3,F4) take in the test data outputted from the flip-flop (F1) in accordance with the sync clock outputted from the flip-flop (F2).</p> |
申请公布号 |
WO2006132329(A1) |
申请公布日期 |
2006.12.14 |
申请号 |
WO2006JP311551 |
申请日期 |
2006.06.08 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION;YOKOTA, TOSHIHIKO;NAMURA, KEN;SUGIMOTO, MITSURU |
发明人 |
YOKOTA, TOSHIHIKO;NAMURA, KEN;SUGIMOTO, MITSURU |
分类号 |
G06F11/22;G01R31/28 |
主分类号 |
G06F11/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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