| 摘要 |
PROBLEM TO BE SOLVED: To precisely measure a characteristic of an input and output circuit directly not through an internal circuit. SOLUTION: A semiconductor device 20 is provided with the internal circuit 1, an input and output buffer circuit 2, an input and an output buffer circuit 3, a test mode selecting circuit 4, a multiplexer MUX1, a multiplexer MUX2, a two-input OR circuit OR1, a two-input OR circuit OR2, an input and output terminal PADIO1 or an input and output terminal PADION, and a test terminal TPAD1 or a test terminal TPADM. When evaluating the characteristics of an input buffer circuit and an output buffer circuit in the input and output buffer circuit directly not through the internal circuit, a bypass line BL1 is selected on the basis of a test control signal TMS2 output from the test mode selecting circuit 4, and an output side of the input buffer circuit BUIN1 in the input and output buffer circuit 2 is connected to an input side of the output buffer circuit BUOUT1 in the input and output buffer circuit 3, by the bypass line BL1. COPYRIGHT: (C)2007,JPO&INPIT
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