Vorrichtung und Verfahren zur auf Spektrumanalyse basierender Messung des Jitters serieller Daten,申请号DE20026015722-传众专利搜索

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发明名称	Vorrichtung und Verfahren zur auf Spektrumanalyse basierender Messung des Jitters serieller Daten
摘要
申请公布号	DE60215722(D1)	申请公布日期	2006.12.14
申请号	DE20026015722	申请日期	2002.06.06
申请人	TEKTRONIX INC.	发明人	WARD, BENJAMIN A.;TAN, KAN;GUENTHER, MARK
分类号	G01R29/02;G01R29/26;G01R23/20;G01R31/317	主分类号	G01R29/02
代理机构		代理人
主权项
地址

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