| 摘要 |
PROBLEM TO BE SOLVED: To solve the problems wherein, though phase adjustment between a strobe signal and an internal state signal is performed hitherto inside a system LSI when observing the internal operation state of the system LSI, necessary man-hours or cost are increased remarkably following miniaturization or speed-up of a semiconductor. SOLUTION: The phase adjustment between the strobe signal and the internal state signal is performed by a measuring device such as a circuit on a printed board outside the system LSI or a logic analyzer, to thereby dispense with phase adjustment inside the LSI. Hereby, a system LSI development period can be shortened, and the cost can be reduced. COPYRIGHT: (C)2007,JPO&INPIT
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