发明名称 Semiconductor device with a high-k gate dielectric and a metal gate electrode
摘要 A semiconductor device is described. That semiconductor device comprises a high-k gate dielectric layer that is formed on a substrate that applies strain to the high-k gate dielectric layer, and a metal gate electrode that is formed on the high-k gate dielectric layer.
申请公布号 US2006278941(A1) 申请公布日期 2006.12.14
申请号 US20050151528 申请日期 2005.06.13
申请人 INTEL CORPORATION 发明人 METZ MATTHEW V.;DATTA SUMAN;DOCZY MARK L.;BRASK JUSTIN K.;KAVALIEROS JACK;CHAU ROBERT S.
分类号 H01L29/94 主分类号 H01L29/94
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