发明名称 METHOD AND APPARATUS FOR MEASURING SAMPLE BY SURFACE PLASMON RESONANCE METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method and an apparatus for analyzing samples including at least two samples or more on the same sensor chip in a surface plasmon resonance sensor device that utilizes external oscillations. SOLUTION: By constituting spacer molecules which fix ligands to be different, frequency characteristics are changed for each spacer molecule. It is possible to measure a plurality of types of a large number of samples including analyte molecules which bond, according to each ligand molecule on the same sensor chip by the differences in the frequency characteristics. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006337244(A) 申请公布日期 2006.12.14
申请号 JP20050163901 申请日期 2005.06.03
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 FUJII EIJI
分类号 G01N21/27;G01N33/53;G01N33/543 主分类号 G01N21/27
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