发明名称 |
Electronic switching circuit, switching circuit test arrangement and method for determining the operativiness of an electronic switching circuit |
摘要 |
The invention relates to an electronic switching circuit in which a plurality of test circuit blocks is provided, whereby every test circuit block comprises a first sub-circuit block and at least one second sub-circuit block. A field effect transistor in the first sub-circuit block has a gate insulation layer that is thicker than the gate insulation layer of a field effect transistor in the second sub-circuit block.
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申请公布号 |
US2006282725(A1) |
申请公布日期 |
2006.12.14 |
申请号 |
US20060377516 |
申请日期 |
2006.03.16 |
申请人 |
KERBER MARTIN;POMPL THOMAS |
发明人 |
KERBER MARTIN;POMPL THOMAS |
分类号 |
G01R31/28;G01R19/175;G01R31/26;G01R31/27;G01R31/30 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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