发明名称 OPEN SHORT TEST DEVICE OF CAMERA MODULE
摘要 An open short test device of a camera module is provided to fix a test position of the camera module by absorbing the camera module by vacuum absorbtion force of a vacuum hole during a test process so as to increase a test accuracy of the camera module. In an open short test device of a camera module(10), an index table(200) installed on a surface of a support board(205) rotates under a condition of the camera module to be loaded thereon with a certain angle. An open short test unit(601), installed on the surface of the support board and electrically connected with the camera module, tests an open/short state of the camera module.
申请公布号 KR20060128088(A) 申请公布日期 2006.12.14
申请号 KR20050048956 申请日期 2005.06.08
申请人 DONG YANG SEMICONDUCTOR CO., LTD. 发明人 KIM, YOUNG GUN;KANG, HAK CHEAL;SHIN, MYEONG SEON;LEE, HAN JIN
分类号 G01M11/00;G03B43/00 主分类号 G01M11/00
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