发明名称 |
OPEN SHORT TEST DEVICE OF CAMERA MODULE |
摘要 |
An open short test device of a camera module is provided to fix a test position of the camera module by absorbing the camera module by vacuum absorbtion force of a vacuum hole during a test process so as to increase a test accuracy of the camera module. In an open short test device of a camera module(10), an index table(200) installed on a surface of a support board(205) rotates under a condition of the camera module to be loaded thereon with a certain angle. An open short test unit(601), installed on the surface of the support board and electrically connected with the camera module, tests an open/short state of the camera module.
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申请公布号 |
KR20060128088(A) |
申请公布日期 |
2006.12.14 |
申请号 |
KR20050048956 |
申请日期 |
2005.06.08 |
申请人 |
DONG YANG SEMICONDUCTOR CO., LTD. |
发明人 |
KIM, YOUNG GUN;KANG, HAK CHEAL;SHIN, MYEONG SEON;LEE, HAN JIN |
分类号 |
G01M11/00;G03B43/00 |
主分类号 |
G01M11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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