发明名称 |
ION SOURCE AND ION IMPLANTER HAVING THE SAME |
摘要 |
An ion source and an ion implantation apparatus having the same are provided to reduce impurity flowed in a gap between an opening unit and a filament by forming an inner diameter of the opening unit greater than a diameter of the filament. An arc chamber(110) provides a space for ionizing a source gas and includes a base plate(112) having an opening unit(126). A filament(130) is installed through the opening unit and emits electrons for ionizing the source gas into the arc chamber. The opening unit has an inner diameter to make a gap between the opening unit and the filament have 1 mm to reduce impurity flowed in the gap. A gas supplying unit(120) is formed on the base plate to supply the source gas into the arc chamber. An ion extraction unit(116) is formed on a sidewall of the arc chamber facing the base plate to extract ions generated in the arc chamber.
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申请公布号 |
KR20060128302(A) |
申请公布日期 |
2006.12.14 |
申请号 |
KR20050049636 |
申请日期 |
2005.06.10 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, SANG HYUN |
分类号 |
H01L21/265 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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