发明名称 ION SOURCE AND ION IMPLANTER HAVING THE SAME
摘要 An ion source and an ion implantation apparatus having the same are provided to reduce impurity flowed in a gap between an opening unit and a filament by forming an inner diameter of the opening unit greater than a diameter of the filament. An arc chamber(110) provides a space for ionizing a source gas and includes a base plate(112) having an opening unit(126). A filament(130) is installed through the opening unit and emits electrons for ionizing the source gas into the arc chamber. The opening unit has an inner diameter to make a gap between the opening unit and the filament have 1 mm to reduce impurity flowed in the gap. A gas supplying unit(120) is formed on the base plate to supply the source gas into the arc chamber. An ion extraction unit(116) is formed on a sidewall of the arc chamber facing the base plate to extract ions generated in the arc chamber.
申请公布号 KR20060128302(A) 申请公布日期 2006.12.14
申请号 KR20050049636 申请日期 2005.06.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, SANG HYUN
分类号 H01L21/265 主分类号 H01L21/265
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