发明名称 |
TOP COATING COMPOSITION FOR PHOTORESIST, AND METHOD FOR FORMING PHOTORESIST PATTERNS USING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a top coating composition for photoresist which is usable in the immersion lithography and to provide a method for forming photoresist patterns using the same. <P>SOLUTION: The top coating composition comprises a polymer having at least three different structures of repeating groups comprising a first repeating unit having a carboxylic group substituted with an alkyl protection group or an acid-decomposable group, a second repeating group having an acid group and a third repeating group having a polar group, and an organic solvent containing an alcohol. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2006336017(A) |
申请公布日期 |
2006.12.14 |
申请号 |
JP20060156204 |
申请日期 |
2006.06.05 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
HATA MITSUHIRO;RYOO MAN-HYOUNG;KIM HYUN-WOO;WOO SANG-GYUN;YOON JIN YOUNG;HAH JUNG-HWAN |
分类号 |
C09D201/08;C08F220/12;C09D7/12;C09D127/12;C09D127/18;C09D129/10;C09D133/06;C09D133/14;C09D157/00;C09D157/10;G03F7/11;H01L21/027 |
主分类号 |
C09D201/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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