发明名称 TOP COATING COMPOSITION FOR PHOTORESIST, AND METHOD FOR FORMING PHOTORESIST PATTERNS USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a top coating composition for photoresist which is usable in the immersion lithography and to provide a method for forming photoresist patterns using the same. <P>SOLUTION: The top coating composition comprises a polymer having at least three different structures of repeating groups comprising a first repeating unit having a carboxylic group substituted with an alkyl protection group or an acid-decomposable group, a second repeating group having an acid group and a third repeating group having a polar group, and an organic solvent containing an alcohol. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006336017(A) 申请公布日期 2006.12.14
申请号 JP20060156204 申请日期 2006.06.05
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 HATA MITSUHIRO;RYOO MAN-HYOUNG;KIM HYUN-WOO;WOO SANG-GYUN;YOON JIN YOUNG;HAH JUNG-HWAN
分类号 C09D201/08;C08F220/12;C09D7/12;C09D127/12;C09D127/18;C09D129/10;C09D133/06;C09D133/14;C09D157/00;C09D157/10;G03F7/11;H01L21/027 主分类号 C09D201/08
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